Coarse tip distance adjustment and positioner for a scanning tunneling microscope
- 1 June 1989
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 60 (6) , 1200-1201
- https://doi.org/10.1063/1.1140287
Abstract
We report on a new coarse tip distance adjustment and positioner for a scanning tunneling microscope, which was designed with ease of sample manipulation and UHV compatibility in mind. It has no mechanical connections in UHV and has been successfully used for measurements of microfaceted platinumsurfaces in air and cleaved Si(111) surfaces under liquids.Keywords
This publication has 1 reference indexed in Scilit:
- An easily operable scanning tunneling microscopeSurface Science, 1987