Transmission Electron Microscopy: Direct Observation of Crystal Structure in Refractory Ceramics
- 10 November 1978
- journal article
- other
- Published by American Association for the Advancement of Science (AAAS) in Science
- Vol. 202 (4368) , 625-626
- https://doi.org/10.1126/science.202.4368.625
Abstract
Using high-resolution multibeam interference techniques in the transmission electron microscope, images have been obtained that make possible a real-space structure analysis of a beryllium-silicon-nitrogen compound. The results illustrate the usefulness of lattice imaging in the analysis of local crystal structure in these technologically promising ceramic materials.Keywords
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