Effect on the Asymmetric Bragg-Case Diffraction of X-Rays on the Yield of X-Ray Photoelectrons from a Silicon Single Crystal
- 1 April 1977
- journal article
- Published by Physical Society of Japan in Journal of the Physics Society Japan
- Vol. 42 (4) , 1433-1434
- https://doi.org/10.1143/jpsj.42.1433
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Variation of the yield of electron emission from a silicon single crystal with the diffraction condition of exciting x-raysPhysics Letters A, 1975
- Intensity Anomaly of X-Ray Compton and Thermal Scatterings Accompanying the Bragg Reflections from Perfect Si and Ge CrystalsJournal of the Physics Society Japan, 1966
- Effect of Dynamical Diffraction in X-Ray Fluorescence ScatteringPhysical Review B, 1964