Structure and properties of oblique-deposited magnetic thin films
- 15 April 1987
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 61 (8) , 3807-3809
- https://doi.org/10.1063/1.338630
Abstract
Structural characterizations of angle-of-incidence CoNi films using electron microscopy are reported. Both fixed-angle-of-incidence and continuous-variation-of-incidence films are included. The tangent rule is found to be valid at high oblique angle. The easy axis as measured from the torque curve and angular variation of coercivity in a 170-nm film deposited at 75° is about 15° inclined to the film plane, whereas the columnar axis is about 30°. A weak c-axis texture exists as revealed by the electron diffraction study. The c-axis texture in the continuous-variation-of-incidence films with and without oxygen is not detected by electron diffraction.This publication has 7 references indexed in Scilit:
- The role of oxygen in oblique-deposited CoNi thin filmsIEEE Transactions on Magnetics, 1986
- CoNiCr/Cr sputtered thin film disksIEEE Transactions on Magnetics, 1985
- Angular variation of the coercivity in magnetic recording thin filmsJournal of Applied Physics, 1985
- Columnar structure and some properties of metal-evaporated tapeIEEE Transactions on Magnetics, 1984
- Magnetic recording media prepared by oblique incidenceIEEE Transactions on Magnetics, 1981
- Columnar microstructure in vapor-deposited thin filmsThin Solid Films, 1977
- Oblique-Incidence Anisotropy in Evaporated Permalloy FilmsJournal of Applied Physics, 1960