Properties of the Shallow Thermal Donors in CZ-Silicon as Studied by Photothermal Ionization Spectroscopy (PTIS)
- 1 January 1986
- journal article
- Published by Trans Tech Publications, Ltd. in Materials Science Forum
- Vol. 10-12, 997-1002
- https://doi.org/10.4028/www.scientific.net/msf.10-12.997
Abstract
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