Lattice Vibrations in Silicon: Microscopic Dielectric Model
- 19 August 1968
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 21 (8) , 536-539
- https://doi.org/10.1103/physrevlett.21.536
Abstract
The phonon-dispersion curves in silicon are calculated from a microscopic model by a dielectric screening theory. The part of the dynamical matrix arising from the diagonal part of the inverse dielectric-function matrix is calculated just as in metals; the off-diagonal part is approximated by interactions of ions and bonds treated as point charges in Phillips's bond-charge model.Keywords
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