Single Electrometer Method of Measuring Transport Properties of High-Resistivity Semiconductors

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Abstract
A method is described whereby the electrical conductivity and Hall coefficient of high-resistivity semiconductors can be measured using a single electrometer for current and voltage measurements. Measurements are made following the L. J. van der Pauw technique with the electrometer switched to perform the necessary functions while maintaining the low side at ground potential. The variation of conductivity and Hall coefficient with temperature can be determined by a point by point method or the data can be recorded on an X-Y recorder. Conductivities as low as 10−10Ω−1·cm−1 have been measured.

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