An approach to analytical modeling of snapback in SOI devices

Publisher Website

4 December 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/sossoi.1990.145686

Abstract

No abstract available

Keywords

This publication has 2 references indexed in Scilit:

Single-transistor latch in SOI MOSFETs
IEEE Electron Device Letters, 1988
Snap-Back: A Stable Regenerative Breakdown Mode of MOS Devices
IEEE Transactions on Nuclear Science, 1983