Beam-Profile Detector

Abstract
A beam‐profile detector that employs a pair of continuously moving scintillation counters as a detector and a PHA as a multichannel scaler is described. The number of counts per fixed number of incident particles at every 0.1 in. of travel is recorded in consecutive channels of the analyzer. A total of 7 in. is traversed in 42 sec after which the profile may immediately be displayed on the CRT readout of the PHA. The device is useful in its present form at accelerators having high beam repetition rates. Plans for its adaptation for use at pulsed accelerators are also discussed.

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