Industrial applications of analytical electron microscopy
- 1 November 1973
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 99 (2) , 165-175
- https://doi.org/10.1111/j.1365-2818.1973.tb04669.x
Abstract
No abstract availableKeywords
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- The present state of quantitative X-ray microanalysis Part 1: Physical basisBritish Journal of Applied Physics, 1963