Propagation loss measurement for surface plasmon-polariton modes at metal waveguides on semiconductor substrates
- 9 February 2004
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 84 (6) , 852-854
- https://doi.org/10.1063/1.1645990
Abstract
Propagation losses were measured for surface plasmon-polariton (SPP) modes at metal waveguides on semiconductor substrates. The waveguides are simple strips of Au or Al deposited on InP substrates or 300-nm-thick SiO2 film covering the InP substrates. We used a direct method that can clearly discriminate SPP modes in vidicon-camera images, thereby allowing quantitative measurements. The loss coefficients measured at a wavelength of 1.55 μm were, as predicted by theory, in the range of 8.5–17 dB/mm, which shows the waveguides are feasible for practical applications.This publication has 16 references indexed in Scilit:
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