Electron energy loss spectrometry: Mean free paths for some characteristic X-ray excitations
- 1 January 1976
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine
- Vol. 33 (1) , 1-10
- https://doi.org/10.1080/14786437608221086
Abstract
A magnetic spectrometer has been used to measure the energy loss spectra of electrons transmitted through thin films in a modified electron microscope. Measurements of the peaks corresponding to characteristic X-ray excitations, after background correction, yield values for the mean free paths of the respective processes. Values are reported for carbon and aluminium K., chromium, iron and copper L-, and silver M-excitationKeywords
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