TEM/STEM Sample Preparation for the Investigation of Solid State Structures: Applications to Electronic Devices and Computer Components
- 1 January 1985
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- The preparation of cross‐section specimens for transmission electron microscopyJournal of Electron Microscopy Technique, 1984