Examining fault-tolerance using unlikely inputs: turning the test distribution up-side down
- 19 November 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
This paper turns the concept of input distributionson its head to exploit "inverse input distributions." Althoughsuch distributions are not true mathematicalinverse functions, they capture the intuitive propertyof members that have high frequencies in the originaldistribution have low frequencies in the "inverse"distribution, and vice versa. These new distributionshave uses in testing for reliability estimates, and moreimportantly, fault-tolerance analysis.1 BackgroundGood...Keywords
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