Second order Raman spectroscopy of the wurtzite form of GaN
- 1 June 1995
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 77 (11) , 6042-6043
- https://doi.org/10.1063/1.359190
Abstract
We report on Raman scattering by phonon pairs in GaN films grown on sapphire substrates by plasma‐enhanced molecular beam epitaxy. The first order data are consistent with results obtained from GaN bulk crystals of the wurtzite structure. The A1 and the much weaker E2 symmetry components of the second order scattering have been identified. Two‐phonon spectra are dominated by contributions due to longitudinal optical phonons. © 1995 American Institute of PhysicsThis publication has 8 references indexed in Scilit:
- Raman scattering from LO phonon-plasmon coupled modes in gallium nitrideJournal of Applied Physics, 1994
- Growth and characterization of GaN on c-plane (0001) sapphire substrates by plasma-enhanced molecular beam epitaxyJournal of Applied Physics, 1993
- Progress and prospects for GaN and the III–V nitride semiconductorsThin Solid Films, 1993
- Raman scattering and x-ray-absorption spectroscopy in gallium nitride under high pressurePhysical Review B, 1992
- First order Raman scattering in GaNSolid State Communications, 1986
- Resonant Raman scattering of TO(A1), TO(E1) and E2 optical phonons in GaNSolid State Communications, 1972
- Optical studies of the phonons and electrons in gallium nitrideSolid State Communications, 1970
- Raman Effect of CorundumThe Journal of Chemical Physics, 1967