EELS quantification of the elements Sr to W by means of M45 edges
- 31 December 1988
- journal article
- research article
- Published by Elsevier in Ultramicroscopy
- Vol. 25 (1) , 81-84
- https://doi.org/10.1016/0304-3991(88)90409-3
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- EELS quantification of M edges by using oxidic standardsUltramicroscopy, 1987
- Inner shell edge profiles in electron energy loss spectroscopyUltramicroscopy, 1985
- Band-structure approach to the x-ray spectra of metalsPhysical Review B, 1984
- K, L, and M shell generalized oscillator strengths and ionization cross sections for fast electron collisionsThe Journal of Chemical Physics, 1980