Reflection high-energy electron diffraction study of Sb incorporation during molecular-beam epitaxy growth of GaSb and AlSb
- 1 March 1992
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 10 (2) , 895-897
- https://doi.org/10.1116/1.586146
Abstract
No abstract availableKeywords
This publication has 0 references indexed in Scilit: