Utilization of high speed x-ray topography for determining diffusion coefficients of point defects in nearly perfect crystals
- 1 July 1989
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 60 (7) , 2494-2497
- https://doi.org/10.1063/1.1140708
Abstract
A new method for determining diffusion coefficients of point defects using synchrotron radiation topography (SRT) is described. Since the method is based on dynamical observations of dislocation motion in a thick specimen with a low dislocation density, advantage of the SRT is fully utilized. It is shown by typical observations on ice crystals that an absolute value of the diffusion coefficient is determined by a simple analysis of the climb motion of the dislocations.Keywords
This publication has 2 references indexed in Scilit:
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- A high-speed X-ray topography camera for use with synchrotron radiation at the photon factoryNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1984