Determination of wavelength dependence of the reflectivity at AR coated diode facets
- 1 November 1993
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Photonics Technology Letters
- Vol. 5 (11) , 1279-1281
- https://doi.org/10.1109/68.250044
Abstract
Wavelength dependence of the reflectivity at an antireflection (AR) coated diode facet has been determined by comparing the spontaneous emission spectra obtained under the same bias condition before and after this facet is AR coated. Reliable measurements can be achieved by proper choice of the bias current.Keywords
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