JFET's fabricated in a standard IC process for bipolar transistors
- 1 August 1978
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 13 (4) , 530-532
- https://doi.org/10.1109/jssc.1978.1051091
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Calculations of Impurity Atom Diffusion Through a Narrow Diffusion Mask OpeningIBM Journal of Research and Development, 1966