On the Preparation of Tensile Test Pieces for Transmission Electron Microscopic Observation
- 1 March 1969
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 8 (3)
- https://doi.org/10.1143/jjap.8.406
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Stress Measurable Tensile Device for Electron Microscopic ObservationJournal of the Physics Society Japan, 1968
- Continuous Observation of Dynamic Behaviors of Dislocations in AluminumJournal of the Physics Society Japan, 1967