W–Ti–O layers for gas-sensing applications: Structure, morphology, and electrical properties
- 1 June 1998
- journal article
- Published by Springer Nature in Journal of Materials Research
- Vol. 13 (6) , 1568-1575
- https://doi.org/10.1557/jmr.1998.0218
Abstract
The kinetics of phase transitions and phase segregation induced by annealing temperature on the Ti–W–O gas-sensing layer was studied by x-ray diffraction, Raman spectroscopy, and scanning electron microscopy. The main goal was to identify, on the basis of kinetics studies, structurally stable Ti–WO3 thin film phases and compare their response to polluting gases in order to determine possible correlations between structural and electrical properties of the sensing layers.Keywords
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