Surface and thin-film analysis: Concepts, capabilities and limitations

• 1 August 1979
• journal article
• Published by Elsevier in Talanta
• Vol. 26  (8) , 665-673
• https://doi.org/10.1016/0039-9140(79)80171-x

Abstract

Keywords

• SURVEY
• SCATTERING
• AUGER
• SECONDARY
• ISS
• SPECTROMETRY
• ROUGHENING
• ESCA
• OUTLINED
• ILLUSTRATE