Absolute atomic-scale measurements of the Gibbsian interfacial excess of solute at internal interfaces
- 1 September 1993
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 48 (9) , 6724-6727
- https://doi.org/10.1103/physrevb.48.6724
Abstract
A method consistent with the Gibbs’ formalism is presented for measuring the Gibbsian interfacial excess of solute (Γ) at an internal interface using atom-probe field-ion microscopy (APFIM). The values of Γ are measured directly, that is, without deconvolution procedures. The relationships between Γ and the thermodynamic-state variables of an internal interface are studied using the techniques of APFIM and transmission electron microscopy (TEM). Examples are given of the application of APFIM-TEM to the measurement of Γ at grain boundaries in an Fe(Si) alloy.Keywords
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