High-performance, focusing-type, time-of-flight atom probe with a channeltron as a signal detector

Abstract
We have constructed a focusing-type, time-of-flight atom probe which enables us to focus the ion beam to a spot of ∼1 mm diameter. Under this condition, a channeltron can be used as a signal detector replacing the conventional channel plate. Practically 100% detection efficiency was achieved for the first time in the atom-probe history.

This publication has 15 references indexed in Scilit: