Wavelength spread of doubly bent crystals for X-ray microfocusing applications
- 1 May 1991
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 56-57, 968-970
- https://doi.org/10.1016/0168-583x(91)95073-m
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
- Neutron optics using non-perfect crystalsPublished by Springer Nature ,2005
- Ellipsoid X-ray focussing for synchrotron-radiation microprobe analysis at the SRS, Daresbury, UKNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1990
- On the phase-space description of synchrotron x-ray beamsReview of Scientific Instruments, 1989
- Trace element determinations with synchrotron-induced x-ray emissionAnalytical Chemistry, 1989
- Synchrotron radiation excited X-ray fluorescence analysis using wide band pass monochromatorsNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1985
- The design of an X-ray microprobe at the SRS Daresbury (UK)Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1984
- On the use of focusing for small-angle scattering experimentsNuclear Instruments and Methods in Physics Research, 1983
- X-ray monochromator geometry for focusing synchrotron radiation above 10 keVNuclear Instruments and Methods, 1980