The Fresnel mode of Lorentz microscopy using a scanning transmission electron microscope
- 31 December 1979
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 4 (3) , 283-292
- https://doi.org/10.1016/s0304-3991(79)80038-8
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- The direct determination of magnetic domain wall profiles by differential phase contrast electron microscopyPublished by Elsevier ,2005
- The application of scanning transmission electron microscopy to the study of thin ferromagnetic filmsJournal of Physics E: Scientific Instruments, 1974
- The Electron Interference Method for Magnetization Measurement of Thin FilmsJapanese Journal of Applied Physics, 1972
- Magnetic phase contrast from thin ferromagnetic films in the transmission electron microscopeJournal of Physics E: Scientific Instruments, 1970
- Mainly on the Fresnel Mode in Lorentz MicroscopyPhysica Status Solidi (b), 1968