Einzel lenses in atom probe designs
- 3 April 1991
- journal article
- Published by Elsevier in Surface Science
- Vol. 246 (1-3) , 450-456
- https://doi.org/10.1016/0039-6028(91)90450-7
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Direct comparison of performances of TOF atom-probe FIM in the linear and energy-compensated modeReview of Scientific Instruments, 1984
- Focussing errors of a multiple-focussing time-of-flight mass spectrometer with an electrostatic sector fieldInternational Journal of Mass Spectrometry and Ion Physics, 1975
- Energy deficits in pulsed field evaporation and deficit compensated atom-probe designsReview of Scientific Instruments, 1974
- Multiple-focusing time-of-flight mass spectrometers Part II. TOFMS with equal energy accelerationInternational Journal of Mass Spectrometry and Ion Physics, 1972