An X-ray device for continuous tracking of moving interfaces in crystalline solids
- 1 July 1995
- journal article
- Published by IOP Publishing in Measurement Science and Technology
- Vol. 6 (7) , 947-952
- https://doi.org/10.1088/0957-0233/6/7/014
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- On the pinning of grain boundary motion by surface groovesScripta Metallurgica et Materialia, 1992
- Synchrotron White Beam X-Ray Topographic In Situ Study of the Different Types of Grain GrowthMaterials Science Forum, 1992
- New possibilities for recrystallization study by X-Ray synchrotron radiation topographyPhysica Status Solidi (a), 1978
- Tilt boundary migration in NaCl bicrystalsActa Metallurgica, 1970