Epitaxial growth of YBa2Cu3O7−δ thin films on LiNbO3 substrates

Abstract
In situ epitaxial growth of YBa2Cu3O7−δ thin films on Y‐cut LiNbO3 substrates using a standard laser ablation technique is reported. Resistance of the films shows a normal metallic behavior and a very sharp (Tc(R=0) of 92 K. High critical current density of Jc(77 K)=2×105 A/cm2 is observed, which is in accordance with epitaxial growth. Film orientation observed from x‐ray diffraction spectra indicates that the c axis is normal to the substrate plane and the a axis is at 45° to the [11.0] direction of the hexagonal lattice of the substrate with two domains in mirror image to the (110) plane.