Design guidelines for deep-sub-micrometer interconnections
- 4 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 34, 413-415
- https://doi.org/10.1109/vmic.1990.127916
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Interconnection and electromigration scaling theoryIEEE Transactions on Electron Devices, 1987