Microprobe Investigations of Copper Precipitates in Silicon Single Crystals
- 1 January 1967
- journal article
- research article
- Published by Wiley in Physica Status Solidi (b)
- Vol. 21 (2) , 627-634
- https://doi.org/10.1002/pssb.19670210221
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Observations of Individual Dislocations and Oxygen Precipitates in Silicon with a Scanning Electron Beam MethodJournal of Applied Physics, 1965
- The Precipitation Behaviour of Copper in Silicon Single CrystalsPhysica Status Solidi (b), 1965