Real-time maximum value determination on an easily testable VLSI architecture
- 1 April 1993
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Circuits and Systems I: Regular Papers
- Vol. 40 (4) , 283-285
- https://doi.org/10.1109/81.224304
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- The VLSI Complexity of SortingIEEE Transactions on Computers, 1983