Electrical evaluation of thin film CdS diodes and transistors
- 31 December 1963
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 6 (6) , 645-655
- https://doi.org/10.1016/0038-1101(63)90059-5
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- CdS thin-film electron devicesSolid-State Electronics, 1963
- Metal—Semiconductor Barrier Height Measurement by the Differential Capacitance Method—One Carrier SystemJournal of Applied Physics, 1963
- Rectification and space-charge-limited currents in CdS filmsSolid-State Electronics, 1962
- Trap Density Determination by Space-Charge-Limited CurrentsJournal of Applied Physics, 1962
- Über den Einfluß der temperaturabhängigen Fermigrenze auf die Leitfähigkeit von HalbleiternAnnalen der Physik, 1952