X-Ray Yield and Line/Background Ratios for Electron Excitation
- 1 March 1965
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 36 (3) , 699-702
- https://doi.org/10.1063/1.1714204
Abstract
X‐ray yield in photons/sr/electron was measured for the Kα lines of Ti, Cr, Mn, Fe, Cu, Zn, Ge, Zr, and the Lα lines of Ta and Au. Incident electron energy was varied from 11 to 38 keV, and for some elements the take‐off angle for emerging x rays was varied from 6 to 45 deg. Theoretical yield values calculated after the method of Metchnik and Tomlin showed an average deviation of about 30% from the measured values, a very satisfactory agreement. Line/background ratios were also measured for the same elements and conditions. Normalization to the natural x‐ray line breadths gave ratios between 100/1 and 26 000/1 depending on the element and experimental conditions. Line/background ratios are consistently larger at low take‐off angles indicating that the characteristic radiation must be generated relatively closer to the surface than the continuum of the same wavelength.This publication has 4 references indexed in Scilit:
- Excitation of Characteristic X Rays by Protons, Electrons, and Primary X RaysJournal of Applied Physics, 1964
- Efficiency of Production of Characteristic X Radiation from Pure Elements Bombarded by ElectronsJournal of Applied Physics, 1964
- On the Absolute Intensity of Emission of Characteristic X RadiationProceedings of the Physical Society, 1963
- The Intensity of Emission of Characteristic X-RadiationProceedings of the Physical Society. Section A, 1956