Losses of grain-oriented 3% silicon steel with orientation near (110) (001)

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Abstract
Losses of grain-oriented 3% silicon steel (G.O.) with orientation near (110)[001] have been measured in order to investigate the lower limit of loss in a polycrystalline lamination steel. Highly oriented G.O. (B8≈1.98T, 60×300×0.30mm) are made by recrystallization under a temperature gradient, then thinned by chemical etching to the desired thickness. Losses of G.O. with a thickness of 0.15mm are very low, i.e., W13/50≈0.2 watts/kg, W17/50≈0.4 watts/kg. This relatively low loss is comparable to that of an amorphous magnetic material. But glass-film formation on G.O. cause an increase in loss of about 0.1 watts/kg in W17/50. Dynamic behavior of magnetic domain walls of G.O. magnetized at 60Hz is performed by the line-sampling stroboscopic technique using a 200 kV scanning electron microscope. Uniform displacemet of domain wall is observed in highly oriented G.O.