The measurement of grain boundary thickness using X–ray diffraction techniques
- 1 December 1979
- journal article
- Published by Taylor & Francis in Philosophical Magazine A
- Vol. 40 (6) , 757-767
- https://doi.org/10.1080/01418617908234872
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- X-ray diffraction study of the structure of large-angle [001] twist grain boundaries in goldPhilosophical Magazine A, 1979
- The detection of the periodic structure of high-angle twist boundariesPhilosophical Magazine, 1975
- An experimental study of coincidence grain boundary structure using displacement fringesJournal of Microscopy, 1974
- A multiwire proportional chamber as an area detector for protein crystallographyJournal of Applied Crystallography, 1974
- Diffraction from periodic arrays of dislocationsPhilosophical Magazine, 1973
- Diffraction from periodic arrays of dislocationsPhilosophical Magazine, 1973
- A field ion microscope study of atomic configuration at grain boundariesActa Metallurgica, 1964