Determination of hydrogen in perfluorinated polyalkylethers using time-of-flight secondary ion mass spectrometry, infrared spectroscopy, and nuclear magnetic resonance spectrometry
- 1 February 1989
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 35 (4) , 507-519
- https://doi.org/10.1016/0169-4332(89)90147-5
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
- Time-of-flight secondary ion mass spectrometry of nylons: detection of high mass fragmentsAnalytical Chemistry, 1985
- Molecular secondary ion mass spectrometry: New dimensions in chemical characterizationApplications of Surface Science, 1985
- Accuracy of Mounted Implement Draft Prediction Using Strain Gages Mounted Directly on Three-Point Linkage SystemTransactions of the ASAE, 1985
- A 252Cf time-of-flight mass spectrometer with improved mass resolutionInternational Journal of Mass Spectrometry and Ion Processes, 1984
- Vibrational spectra and conformations of 1,1,2-trifluoroethane and 1,1,2,2-tetrafluoroethaneThe Journal of Physical Chemistry, 1982
- Thermal oxidative studies of poly(hexafluoropropene oxide) fluidsJournal of Applied Polymer Science, 1979
- Analysis of Submonolayers on Silver by Negative Secondary Ion EmissionPhysica Status Solidi (b), 1969
- Properties of polyvinylidene fluoride. Part II. Infrared transmission of normal and thermally decomposed polymerJournal of Polymer Science, 1961