Measurement of Surface Shape by Scanning Electron Microscope Using Detection of Normal
- 1 January 1986
- journal article
- Published by Elsevier in CIRP Annals
- Vol. 35 (1) , 365-368
- https://doi.org/10.1016/s0007-8506(07)61907-6
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Surface roughness measurement by scanning electron microscope. By digital processing.TRANSACTIONS OF THE JAPAN SOCIETY OF MECHANICAL ENGINEERS Series C, 1985
- Surface Roughness Measurement by Scanning Electron MicroscopeCIRP Annals, 1982