Microanalysis with Ultrasoft X-Radiations*
- 1 January 1961
- journal article
- Published by Cambridge University Press (CUP) in Advances in X-ray Analysis
- Vol. 5, 285-305
- https://doi.org/10.1154/s0376030800001646
Abstract
The diffraction, reflection, absorption, fluorescence, and the electronic emission that results from the interaction with ultrasoft X-rays (λ > 10 A) are presented as practical bases for microanalysis. Recent developments on sources and detectors for the ultrasoft X-radiations are described. A preliminary report on a current investigation on low-energy photo-Auger electron analysis and on a new type of low-energy electron spectrometer is also presented.Keywords
This publication has 3 references indexed in Scilit:
- Semiempirical Determination of Mass Absorption Coefficients for the 5 to 50 Angstrom X-Ray RegionJournal of Applied Physics, 1957
- Submicroscopic Structure Determination by Long Wavelength X-Ray DiffractionJournal of Applied Physics, 1955
- Surface Studies of Solids by Total Reflection of X-RaysPhysical Review B, 1954