Sampling effects in CdHgTe focal plane arrays

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Abstract
Focal plane arrays (FPA) of CdHgTe detectors have been incorporated successfully into infrared imagers with sensitivities in either the 3-5 µm or 8-14 µm bands. Whilst it has been possible to obtain good imagery with minimal fixed pattern noise using digital non-uniformity correction electronics, these imagers suffer from problems caused by the sampling of the scene by the FPA; in particular, aliasing results in the obscuration of high frequency detail in the scene and its appearance at lower frequencies below the Nyquist frequency. It is demonstrated how microscanning may be used to reduce these sampling effects and in addition, ways of improving the ease of viewing of the final image by reducing the degree of pixelation are discussed.

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