A soft-x-ray-emission investigation of cobalt implanted silicon crystals
- 1 June 1991
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 69 (11) , 7800-7804
- https://doi.org/10.1063/1.347508
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Local partial densities of states in Ni and Co silicides studied by soft-x-ray-emission spectroscopyPhysical Review B, 1991
- Silicide structural evolution in high-dose cobalt-implanted Si(100) crystalsPhysical Review B, 1989
- Mesotaxy: Single-crystal growth of buried CoSi2 layersApplied Physics Letters, 1987
- High-efficiency soft x-ray emission spectrometer for use with synchrotron radiation excitationReview of Scientific Instruments, 1986