Study of a Si(110) surface by using reflection high-energy electron diffraction-total reflection angle X-ray spectroscopy and high temperature scanning tunneling microscopy
- 20 June 1994
- journal article
- Published by Elsevier in Surface Science
- Vol. 313 (1-2) , 155-167
- https://doi.org/10.1016/0039-6028(94)91163-0
Abstract
No abstract availableThis publication has 32 references indexed in Scilit:
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