Preparation and x-ray diffraction studies of compositionally modulated PbTe/Bi films
- 1 January 1984
- journal article
- research article
- Published by Elsevier in Thin Solid Films
- Vol. 111 (4) , 323-330
- https://doi.org/10.1016/0040-6090(84)90324-9
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
- Thermoelectricity in composition-modulated Cu-Ni foilsApplied Physics Letters, 1982
- Magnetic behavior and structure of compositionally modulated Cu-Ni thin filmsPhysical Review B, 1982
- Modulated semiconductor structures: An overview of some basic considerations for growth and desired electronic structureJournal of Vacuum Science and Technology, 1982
- A note on compositionally modulated Cu-Ni films with lattice-commensurate wavelengthsApplied Physics Letters, 1981
- GaAs/AlAs layered filmsThin Solid Films, 1979
- Artificial layer structures and their propertiesAIP Conference Proceedings, 1979
- X-ray diffraction from one-dimensional superlattices in GaAs1−xPxcrystalsJournal of Applied Crystallography, 1973
- The structure and growth of PbTe films on mica substratesPhilosophical Magazine, 1969
- Effect of Coherency Strains on Diffusion in Copper-Palladium AlloysJournal of Applied Physics, 1969
- Stabilities of Gaseous Molecules in the Pb–Se and Pb–Te SystemsThe Journal of Chemical Physics, 1961