Improved methods for the determination of the spherical aberration coefficient in high-resolution electron microscopy from micrographs of an amorphous object
- 31 December 1991
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 38 (3-4) , 225-233
- https://doi.org/10.1016/0304-3991(91)90157-2
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Measurement of the spherical aberration coefficient of transmission electron microscopes by beam-tilt-induced image displacementsUltramicroscopy, 1991
- Electron holography approaching atomic resolutionUltramicroscopy, 1985
- Improved high resolution image processing of bright field electron micrographs: I. TheoryUltramicroscopy, 1984
- Measurement of focus and spherical aberration of an electron microscope objective lensUltramicroscopy, 1976