Low-loss ring resonators fabricated from silicon based integrated optics technologies

25 April 1991

journal article
Published by Institution of Engineering and Technology (IET) in Electronics Letters

Vol. 27 (9) , 722-724
https://doi.org/10.1049/el:19910449

Abstract

The fabrication of low-loss ring resonators using silicon based integrated optics technologies is reported. Propagation losses of 0.028 ±0.009dB/cm have been deduced from finesse measurements.

Keywords

FINESSE MEASUREMENTS
SI BASED INTEGRATED OPTICS
LOW-LOSS RING RESONATORS
PROPAGATION LOSSES
FABRICATION

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