A high-speed, low-power Hi-CMOS 4K static RAM

• 1 January 1978
• conference paper
• Published by Institute of Electrical and Electronics Engineers (IEEE)
• p. 110-111
• https://doi.org/10.1109/isscc.1978.1155749

Abstract

Keywords

• READ-WRITE MEMORY
• MOS DEVICES
• VOLTAGE
• CIRCUITS
• CMOS TECHNOLOGY
• CAPACITANCE
• LABORATORIES
• PLASTIC PACKAGING
• PLASTICS INDUSTRY
• SEMICONDUCTOR DEVICE MEASUREMENT