Atomic-scale tip-sample interactions and contact phenomena
- 31 July 1992
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 42-44, 16-21
- https://doi.org/10.1016/0304-3991(92)90241-b
Abstract
No abstract availableKeywords
This publication has 28 references indexed in Scilit:
- Roles of the attractive and repulsive forces in atomic-force microscopyPhysical Review B, 1991
- Site-dependent electronic effects, forces, and deformations in scanning tunneling microscopy of flat metal surfacesPhysical Review B, 1990
- Holography with low-energy electronsPhysical Review Letters, 1990
- Observation of metallic adhesion using the scanning tunneling microscopePhysical Review Letters, 1990
- Direct spectroscopy of electron and hole scatteringPhysical Review Letters, 1990
- Tip-sample interaction effects in scanning-tunneling and atomic-force microscopyPhysical Review B, 1990
- Atomic theory of scanning tunneling microscopyPhysical Review B, 1989
- Theoretical scanning tunneling microscopy and atomic force microscopy study of graphite including tip–surface interactionJournal of Vacuum Science & Technology A, 1988
- Scanning-tunneling microscopy at small tip-to-surface distancesPhysical Review B, 1987
- Surface Studies by Scanning Tunneling MicroscopyPhysical Review Letters, 1982