Applications of pattern recognition in semiconductor and printed board production
- 1 September 1983
- journal article
- Published by Elsevier in Signal Processing
- Vol. 5 (5) , 399-412
- https://doi.org/10.1016/0165-1684(83)90003-8
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Optical Linewidth Measurements On WafersPublished by SPIE-Intl Soc Optical Eng ,1978
- An Automatic Optical Printed Circuit Inspection SystemPublished by SPIE-Intl Soc Optical Eng ,1977
- A Transistor Wire-Bonding System Utilizing Multiple Local Pattern Matching TechniquesIEEE Transactions on Systems, Man, and Cybernetics, 1976
- A process for detecting defects in complicated patternsComputer Graphics and Image Processing, 1973