Determination of thickness, refractive index, and dispersion of waveguiding thin films with an Abbe refractometer
- 1 October 1980
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 19 (19) , 3261-3262
- https://doi.org/10.1364/ao.19.003261
Abstract
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This publication has 6 references indexed in Scilit:
- Holography with guided optical wavesApplied Physics B Laser and Optics, 1980
- Measurements of refractive-index dispersion by optical waveguidingApplied Physics Letters, 1979
- Wave propagation in low-loss acrylic resin filmsOptical and Quantum Electronics, 1975
- Numerical solution of the mode-equation of planar dielectric waveguides to determine their refractive index and thickness by means of a prism-film couplerOptics Communications, 1973
- Measurement of Thin Film Parameters with a Prism CouplerApplied Optics, 1973
- Light Waves in Thin Films and Integrated OpticsApplied Optics, 1971